Khóa học online - Metallurgy - Materials Characterization - by NPTEL

Category: Materials Science and Engineering Published: 27 December 2016
Hits: 1038

Metallurgy - Materials Characterization

Materials Characterization by Dr. S. Sankaran, Department of Metallurgical & Materials Engineering,IIT Madras. For more details on NPTEL visit

Lec-01 Properties of light, Image formation

Lec-02 Magnification and resolution

Lec-03 Depth of field,focus and field of view


Lec-04 Lens defects,filters and light microscopy introduction


Lec-05 Optical microscope demo., Bright field imaging, opaque specimen illumination


Lec-06 Opaque stop microscopy, Phase contrast microscopy


Lec-07 Dark field microscopy, Polarization microscopy


Lec-08 Differential interference contrast and fluorescence microscopy


Lec-09 Sample preparation techniques for optical microscopy


Lec-10A Tutorial problems


Lec-10B continuation Tutorial problems


Lec-11 Introduction to scanning electron Microscopy


Lec-12 Lens aberrations, Object resolution, Image quality


Lec-13 Interaction between electrons and sample, Imaging capabilities, Structural analysis


Lec-14 SEM and its mode of operation, Effect of aperture size,Working distance


Lec-15 SEM and its mode of operation continuation, Relation between probe current and probe


Lec-16 Factors affecting Interaction volume, Demonstration of SEM


Lec-17 Image formation and interpretation


Lec-18 Image formation and interpretation continued, EDS, WDS


Lec-19 Special contrast mechanisms, Monte Carlo simulations of Interaction volume


Lec-20 Electron channeling contrast imaging (ECCI), Electron back scattered diffraction (EBSD)


Lec-21 Tutorial Problems on SEM


Lec-22 Basics of X-ray emission from source, electron excitation and X-ray interaction


Lec-23 Properties of X-rays


Lec-24 Bragg's Law Derivation


Lec-25 Diffraction relationship with reciprocal space


Lec-26 X-ray scattering


Lec-27 Factors affecting intensities of X-ray peaks


Lec-28 Factors affecting intensities of X-ray peaks- continuation


Lec-29 Effect of crystallite size and strain on intensity of X-rays


Lec-30 Profile fit, Factors affecting peak broadening


Lec-31 Indexing of diffraction pattern, Quantitative analysis


Lec-32 Indexing, Quantitative analysis-continuation, Residual stress measurements


Lec-33 XRD and Residual stress measurement- lab demonstration


Lec-34 Introduction to Transmission Electron Microscopy (TEM)


Lec-35 Fundamentals of Transmission Electron Microscopy (TEM)


Lec-36 Basics of Diffraction-1


Lec-37 Basics of Diffraction-2


Lec-38 TEM imaging-1


Lec-39 TEM imaging-2


Lec-40 TEM instrument demonstration


Lec-41 TEM sample preparation-1


Lec-42 TEM sample preparation-2


Author: Social Learning Network
About: Teaching resource - the 1st Vietnamse Portal in Metallurgy and Materials Technology. Cổng thông tin về lĩnh vực luyện kim và kỹ thuật vật liệu. Lĩnh vực chủ chốt: gang trắng Cr cao, thiêu kết xung điện plasma, xử lý nhiệt, tự động hóa trong luyện kim, luyện kim phi coke, động học hoàn nguyên Oxit sắt.


Donate using PayPal